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Fax +49 60 78 / 7 40 06
eMail info[at]jasco.de
 

 

FT-IR Solutions

With over forty years of experience in infrared spectroscopy, JASCO introduces a new series of advanced FT-IR instruments and sampling accessories. Now we offer the most complete selection of FT-IR capability from education and routine analysis to high performance research sysytems plus specially optimized dedicated systems for advanced technology applications such as measuring film thickness and CVD in-situ monitoring for semiconductor research.

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