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FT-IR Microscopy and Imaging Systems

JASCO is proud to release two innovative FT-IR Microscope accessories, the IRT-5000 and IRT-7000, providing several new functions that drastically improve infrared microspectroscopy analyses. Both microscope systems can be easily interfaced with either the FT/IR-4000 or FT/IR-6000 spectrometer, offering the most advanced microscopy and imaging systems available in the market today. Coupling JASCO's proven technology for infrared spectroscopy (accumulated over 50 years) and with the most advanced optical design, the IRT-5000 and 7000 offer the best solution for even the most challenging sample analyses.

  • High optical throughput
  • Excellent signal to noise ratio
  • High spatial resolution
  • Operational flexibility
  • Expandable capabilities
  • Full range of accessories

FT-IR Micro-area Analysis:
IQ Mapping™

JASCO's new FT-IR microscope systems feature an innovative capability for sample analysis, "IQ Mapping". This function enables automated multi-point mapping, line mapping and IR Imaging analyses of a microscopic area with a manual sample stage and a single element detector. The microscope system automatically scans the specified points or area, rapidly collecting a full spectrum of each point without moving the sample stage.
The IQ Mapping function can provide a measurement of a maximum area of 400 μm square using the 16× cassegrain objective. The combination of IQ Mapping with the automated XYZ stage provides a wide area analysis capability.

Sampling Flexibility:

A wide range of data acquisition modes provides the best solution for almost any type of sample and application.

  • IQ Mapping
    Single point
    Line Mapping
    Grid Mapping
    Micro-ATR Mapping
  • IQ Mapping with automatic X-Y-Z stage
    Wide-area Mapping
    Multi-ATR Mapping
  • Linear array detector and rapid scan
    IR Imaging
  • Linear array detector and step scan
    Dynamic Imaging

ATR Mapping using the IQ Mapping function
Sample: silica bead (HPLC packing material)

Colored 3D display of Si-O peak area near 1100 cm-1
Sample: 2 µm Silica bead


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