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MSV-5000 UV-Visible Microspectrometer Series

The MSV-5000 incorporates a double-beam scanning spectrophotometer for optimum measurements in the UV-Vis to NIR region (200-2700 nm).

System Description

A broad range of applications including the collection of transmittance/reflectance spectra of a sample, measurement of the band gap and film thickness of semiconductors, evaluation of the optical characteristics of functional crystals and the color analysis of microscopic samples can be easily implemented using the MSV-5000 series.

The MSV-5000 series includes 3 different microscope systems:

MSV-5100 Spectrophotometer

The MSV-5100 is a dedicated UV-Vis microscope with a wavelength range of (200-900 nm).

MSV-5200 Spectrophotometer

The MSV-5200 includes a Peltier-cooled PbS detector and has a wavelength range of (200-2700 nm).

MSV-5300 Spectrophotometer

The MSV-5300 incorporates an InGaAs detector to obtain optimized NIR measurements and has a wavelength range of (200-1700 nm).

The wide-band cassegrain objectives provide continuous transmittance/reflectance measurements for the entire spectral range desired, without the use of expensive, coated refractive objectives. An optional automated XYZ stage also offers mapping/imaging capability for larger samples.

A PC-controlled objective carousel can be used to select any of the available 10X, 16X or 32X objectives in combination with the standard optical zoom feature to provide enhanced video imaging of the sample utilizing a high-resolution CMOS camera. Options include binocular viewing, polarized observation and selected refractive objective lenses.

All models incorporate a user-selectable slitwidth for variable spectral resolution as well as selectable circular apertures and an adjustable rectangular aperture for sample area discrimination.

System Features

Wide spectral measurement range

The microscope system utilizes wide-band cassegrain objectives to provide transmittance/reflectance measurements continuously from 200 to 2700 nm (MSV-5200).

Polarization measurement

An automated Glan-Taylor polarizer system (standard) provides polarization measurements in combination with the optional automated polarization analyzer.

Auto XYZ stage

The optional automated stage enhances the operation performance of the system especially for mapping and multi-point measurements.

JASCO Spectra Manager™ II

Spectra Manager™ II software, a cross-platform control and analysis package for all JASCO spectroscopic instruments, offers quick and easy data acquisition and analysis.

Specifications
 

Model MSV-5100 MSV-5200 MSV-5300
Optical System
Double beam single monochromator Czerny-Turner mount
Light Source
30W Deuterium lamp, 20W Halogen lamp
Light Source (Option)
150W Xenon lamp (air-cooled)
Wavelength Range 200 - 900 nm 200 - 2700 nm 200 - 1600 nm
Wavelength Accuracy ± 0.3 nm (656.1 nm)
± 0.3 nm (656.1 nm)
± 1.5 nm (1312.2 nm)
Spectral Bandwidth 1, 2, 5, 10, L2, L5, L10 nm 1, 2, 5, 10, L2, L5, L10 nm (UV/Vis)
4, 8, 20, 40, L8, L20, L40 nm (NIR)
1, 2, 5, 10, L2, L5, L10 nm (UV/Vis)
2, 4, 10, 20, L4, L10, L20 nm (NIR)
Scan Modes
Continuous scan, step scan
Detector PMT PMT
Peltier-cooled PbS
PMT
Peltier-cooled InGaAs
Sample Observation
High resolution CMOS camera (1600 × 1200 pixel), optical zoom, ATOS feature, LED illumination
Sample Observation (Option)
Binocular, polarized observation, objective lens
Objective
Cassegrain objective, ×10, ×16, ×32 selectable *1
Condenser Mirror
Cassegrain collection mirror, ×10, ×16, ×32 user-interchangeable *1
(Automated condenser mirror compensation function)
Aperture
User-selectable dual-aperture settings for circular and rectangular (slit type) apertures
10, 20, 30, 50, 100, 200 µmf (×16 objective)
5, 10, 15, 25, 50, 100 µmf (×32 objective)
16, 32, 48, 80, 160, 320 µmf (×10 objective)
Sample Stage
Manual stage (working area: X 50 × Y 75 × Z 20 mm) *2
Sample Stage (Option)
Auto stage (working area: X 76 × Y 52 × Z 25 mm, 1 µm step) *2, joystick (option)
Polarizer
Glan-Taylor, automatic insertion/angle setting
Analyzer (Option):
Glan-Taylor, automatic insertion/angle setting
Control Panel
Cassegrain switching and indicator, transmittance/reflectance mode indicator, aperture selection,
measurement start/stop, auto focus, automatic condenser mirror compensation, optical zoom,
automated sample illumination, sample compartment illumination ON/OFF, ATOS illumination ON/OFF
Dimensions
700 (W) × 740 (D) × 640 (H) mm
Weight
105 kg
Power Requirement
150 VA
Software
JASCO Spectra Manager ™ II
OS
Windows7 Professional
Program
Microscope Measurement (multi-point measurement, line and lattice mapping), Micro Spectra Analysis, Spectra Analysis (data processing such as ?lm thickness calculation, color calculation, peak detection, derivatives), Time-Course Measurement, Validation, JASCO Canvas, Administrative Tools
Program (Option) *3
Fixed wavelength mapping (line and lattice mode), auto focus, multi-image

 

*1. Cassegrain objective and cassegraing collection mirror are provided with the same magnification.
*2. The moving distance of the condensor mirror and the objective magni?cation depends upon the sample.
*3. Optional programs are provided when auto stage is selected.

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